Auteur: COLMENERO J

RIEDEL C, ARINERO R, TORDJEMAN Philippe, COLMENERO J (2010) Dielectric properties of thin insulating layers measured by Electrostatic Force Microscopy. Eur. Phys. J. Appl. Phys., 50 . pp. 10501-10509.

RIEDEL C, SWEENEY R, TORDJEMAN Philippe, COLMENERO J (2010) Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy. Appl. Phys. Lett. , 96 . 213110. ISSN 0003-6951

RIEDEL C, ARINERO R, TORDJEMAN Philippe, COLMENERO J (2010) Quantitative Mapping of NanoDielectrics with Electrostatic Force Microscopy. NON SPECIFIÉ.