Auteur: RIEDEL C.Nombre de documents: 5.
SCHARTZ G., RIEDEL C., TORDJEMAN Philippe (2011) Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM). Ultramicroscopy, 111 . pp. 1366-1369. ISSN 0304-3991 RIEDEL C., ALEGRIA A., TORDJEMAN Philippe, COLMENERO J. (2010) High and low molecular weight crossovers in the longest relaxation time dependence of linear cis-1,4 polyisoprene by dielectric relaxations. Springer. RIEDEL C., ARINERO R., TORDJEMAN Philippe, COLMENERO J. (2010) nanodielectric mapping of a model PS-PVAc blend by EFM. Phys. Rev. E, 81 . 01801. ISSN 1539-3755 RIEDEL C., ARINERO R., TORDJEMAN Philippe, RAMONDA M., LEVEQUE G., SCHWARTZ D., ALEGRIA A., COLMENERO J. (2009) Determination of the nanoscale dielectric constant by means of a double pass method using Electrostatic Force Microscopy. J. Appl. Phys., 106 . 024315. ISSN 0021-8979 RIEDEL C., ALEGRIA A., TORDJEMAN Philippe, COLMENERO J. (2009) Rouse-Model-Based Description of the Dielectric Relaxation of Nonentangled Linear 1,4-cis-Polyisoprene. Macromolecules, 42 . 8492. ISSN 0024-9297 |
