Auteur: RIEDEL C

ARINERO R, RIEDEL C, TORDJEMAN Philippe (2011) Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy. In: Microscopy: Science, Technology, Applications and Education 4. A. Méndez-Vilas, J. Díaz, pp. 1963-1977. ISBN 978-84-614-6191-2

RIEDEL C, ARINERO R, TORDJEMAN Philippe, COLMENERO J (2010) Dielectric properties of thin insulating layers measured by Electrostatic Force Microscopy. Eur. Phys. J. Appl. Phys., 50 . pp. 10501-10509.

RIEDEL C, SWEENEY R, TORDJEMAN Philippe, COLMENERO J (2010) Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy. Appl. Phys. Lett. , 96 . 213110. ISSN 0003-6951

RIEDEL C, SCHARTZ G, ARINERO R, TORDJEMAN Philippe (2010) Nanoscale dielectric properties of insulating thin films: from single point measurements to quantitative images. ultramicroscopy, 110 . 634. ISSN 0304-3991

RIEDEL C, ARINERO R, TORDJEMAN Philippe, COLMENERO J (2010) Quantitative Mapping of NanoDielectrics with Electrostatic Force Microscopy. NON SPECIFIÉ.