Auteur: SCHWARTZ D.Nombre de documents: 1.
RIEDEL C., ARINERO R., TORDJEMAN Philippe, RAMONDA M., LEVEQUE G., SCHWARTZ D., ALEGRIA A., COLMENERO J. (2009) Determination of the nanoscale dielectric constant by means of a double pass method using Electrostatic Force Microscopy. J. Appl. Phys., 106 . 024315. ISSN 0021-8979 |
