Auteur: TORDJEMAN Philippe

ARINERO R, RIEDEL C, TORDJEMAN Philippe (2011) Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy. In: Microscopy: Science, Technology, Applications and Education 4. A. Méndez-Vilas, J. Díaz, pp. 1963-1977. ISBN 978-84-614-6191-2

SCHARTZ G., RIEDEL C., TORDJEMAN Philippe (2011) Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM). Ultramicroscopy, 111 . pp. 1366-1369. ISSN 0304-3991

RIEDEL C., ALEGRIA A., TORDJEMAN Philippe, COLMENERO J. (2010) High and low molecular weight crossovers in the longest relaxation time dependence of linear cis-1,4 polyisoprene by dielectric relaxations. Springer.

CHINAUD Maxime, DELAUNAY Thomas, TORDJEMAN Philippe (2010) An experimental study of particle sedimentation using ultrasonic speckle velocimetry. Meas. Sci. Technol. , 21 . 055402. ISSN 0957-0233

RIEDEL C, ARINERO R, TORDJEMAN Philippe, COLMENERO J (2010) Dielectric properties of thin insulating layers measured by Electrostatic Force Microscopy. Eur. Phys. J. Appl. Phys., 50 . pp. 10501-10509.

RIEDEL C., ARINERO R., TORDJEMAN Philippe, COLMENERO J. (2010) nanodielectric mapping of a model PS-PVAc blend by EFM. Phys. Rev. E, 81 . 01801. ISSN 1539-3755

RIEDEL C, SWEENEY R, TORDJEMAN Philippe, COLMENERO J (2010) Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy. Appl. Phys. Lett. , 96 . 213110. ISSN 0003-6951

RIEDEL C, SCHARTZ G, ARINERO R, TORDJEMAN Philippe (2010) Nanoscale dielectric properties of insulating thin films: from single point measurements to quantitative images. ultramicroscopy, 110 . 634. ISSN 0304-3991

RIEDEL C, ARINERO R, TORDJEMAN Philippe, COLMENERO J (2010) Quantitative Mapping of NanoDielectrics with Electrostatic Force Microscopy. NON SPECIFIÉ.

RIEDEL C., ARINERO R., TORDJEMAN Philippe, RAMONDA M., LEVEQUE G., SCHWARTZ D., ALEGRIA A., COLMENERO J. (2009) Determination of the nanoscale dielectric constant by means of a double pass method using Electrostatic Force Microscopy. J. Appl. Phys., 106 . 024315. ISSN 0021-8979

RIEDEL C., ALEGRIA A., TORDJEMAN Philippe, COLMENERO J. (2009) Rouse-Model-Based Description of the Dielectric Relaxation of Nonentangled Linear 1,4-cis-Polyisoprene. Macromolecules, 42 . 8492. ISSN 0024-9297

TORDJEMAN Philippe, MOREL N., RAMONDA M. (2009) Tribological properties of silicate materials on nano and microscale. Appl. Surface Sci., 255 . 6999. ISSN 0169-4332

MOREL N., TORDJEMAN Philippe, AUGEREAU F., ATTAL J. (2008) Brittle wear of silicate materials by Hertzian rubbing contact. J. Phys. D-Appl. Phys., 41 . 035307. ISSN 0022-3727

GASPAROUX J., LAUX D., FERRANDIS J.Y., ATTAL J., TORDJEMAN Philippe (2008) Large frequency bands viscoelastic properties of honey. J. Non-Newt. Fluid. Mech, 153-1 . 46.